SCANiD Walkthrough Attendance
RFID Walkthrough Attendance System
Students move naturally through a configured school entrance while SCANiD RFID readers detect registered identities automatically. No manual student scanning is required for the walkthrough workflow.
What this solution does
Walk Through Naturally
Attendance detection is designed around normal student movement through configured entrance points.
Entry & Exit Events
The system can record configured punch-in and punch-out events for attendance workflows.
Connected Workflow
Attendance information can connect to reporting, parent communication and the wider SCANiD platform.
Product brochure
View the detailed SCANiD brochure below or download it for your school team.
See SCANiD in your school environment.
Talk to our team about deployment, integration and the right configuration for your campus.